LogicVision to Demonstrate Desktop Silicon Debug and Characterization at DAC 2008

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SAN JOSE, Calif., May 29 /PRNewswire-FirstCall/ — LogicVision, Inc. (Nasdaq: LGVN), the leading provider of semiconductor built-in-self-test (BIST) and diagnostic solutions, today announced that it will showcase the latest release of its Silicon Insight(TM) Desktop product at DAC 2008 using a customer performance board for a 65 nm SoC device. LogicVision will also demonstrate its SerDes BIST solution with Silicon Insight characterizing a 6.2 Gbps SerDes high-speed I/O. Silicon Insight is a key component of LogicVision’s recently announced Dragonfly Test Platform(TM). Silicon Insight and the new Dragonfly Test Platform will be demonstrated at Booth 1620 at the Design Automation Conference 2008, June 9-12 in Anaheim, CA.

About Silicon Insight

Silicon Insight Desktop provides comprehensive, at-speed, SoC device-level debug and characterization using a PC laptop connected to a device performance board through a USB-to-JTAG cable interface. The latest release of Silicon Insight adds support for GPIB-based benchtop equipment, enabling design and test engineers to also perform voltage and frequency based characterization from the same laptop PC environment. Silicon Insight now makes it possible to perform full device debug, diagnostics, and characterization without the need to access or tie-up expensive automatic test equipment.

On the production floor, Silicon Insight now adds the option to perform automated production data logging, enabling product engineering teams and their foundry partners to analyze detailed failure and performance data. The production data log can be used with LogicVision’s Yield Insight(TM) tool to identify systemic yield-limiting issues and help accelerate product yield ramps.

 

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Posted on May 31st, 2008
Written by: PCMAN
Categories | News |

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